《ISO 16845-1-2016原版完整文件.docx》由会员分享，可在线阅读，更多相关《ISO 16845-1-2016原版完整文件.docx（136页珍藏版）》请在taowenge.com淘文阁网|工程机械CAD图纸|机械工程制图|CAD装配图下载|SolidWorks_CaTia_CAD_UG_PROE_设计图分享下载上搜索。
1、INTERNATIONAL STANDARDISO 16845-1First edition 2016-11-01Provided by IHS under license with ISONo reproduction or networking permitted without license from IHSNot for Resale, 2016/12/22 00:57:39Road vehicles Controller area network (CAN) conformance test plan Part 1:Data link layer and physical sign
2、allingVhicules routiers Plan dessai de conformit du gestionnaire de rseau de communication (CAN) Partie 1: Couche liaison de donnes et signalisation physique-,-,-Reference number ISO 16845-1:2016(E)International Organization for StandardizationLicensee=ZHEJIANG INST OF STANDARDIZATION C1 5956617 ISO
3、 2016ISO 16845-1:2016(E)COPYRIGHT PROTECTED DOCUMENT ISO 2016, Published in SwitzerlandAll rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the
4、 internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISOs member body in the country of the requester.ISO copyright officeCh. de Blandonnet 8 CP 401CH-1214 Vernier, Geneva, Switzerland Tel. +41 22 749 01 11Fax +41 22 749 09 4
5、7copyrightiso.orgwww.iso.orgii-,-,- ISO 2016 All rights reservedInternational Organization for StandardizationLicensee=ZHEJIANG INST OF STANDARDIZATION C1 5956617ISO 16845-1:2016(E)ContentsPageForewordviiIntroductionviii1 Scope12 Normative references13 Terms and definitions14 Abbreviated terms35 Glo
6、bal overview45.1 Scope of test plan45.2 Architecture of test plan45.3 Organization55.3.1 General organization55.3.2 Test case organization65.3.3 Hierarchical structure of tests76 LT parameters86.1 Overview86.2 Description of parameters86.2.1 Communication parameters86.2.2 Application parameters96.2.
7、3 Bit rate configuration parameter variation for bit timing tests107 Test type 1, received frame107.1 Test class 1, valid frame format107.1.1 Identifier and number of data test in base format107.1.2 Identifier and number of data test in extended format117.1.3 Reception after arbitration lost127.1.4
8、Acceptance of non-nominal bit in base format frame137.1.5 Acceptance of non-nominal bit in extended format frame137.1.6 Protocol exception behaviour on non-nominal bit147.1.7 Minimum time for bus idle after protocol exception handling157.1.8 DLC greater than 815-,-,-7.1.9 Absent bus idle Valid frame
9、 reception167.1.10 Stuff acceptance test in base format frame167.1.11 Stuff acceptance test in extended format frame177.1.12 Message validation187.2 Test class 2, error detection197.2.1 Bit error in data frame197.2.2 Stuff error for basic frame197.2.3 Stuff error for extended frame207.2.4 Stuff erro
10、r for FD frame payload bytes217.2.5 CRC error227.2.6 Combination of CRC error and form error237.2.7 Form error in data frame at “CRC delimiter” bit position247.2.8 Form error at fixed stuff bit in FD frames247.2.9 Form error in data frame at “ACK delimiter” bit position257.2.10 Form error in data fr
11、ame at “EOF”257.2.11 Message non-validation267.3 Test class 3, error frame management267.3.1 Error flag longer than 6 bits267.3.2 Data frame starting on the third bit of intermission field277.3.3 Bit error in error flag277.3.4 Form error in error delimiter287.4 Test class 4, overload frame managemen
12、t287.4.1 MAC overload generation during intermission field28International Organization for SItaSnOdard2iz0at1ion6 All rights reservedLicensee=ZHEJIANG INST OF STANDARDIZATION C1 5956617iiiISO 16845-1:2016(E)7.4.2 Last bit of EOF297.4.3 Eighth bit of an error and overload delimiter297.4.4 Bit error i
13、n overload flag307.4.5 Form error in overload delimiter307.4.6 MAC overload generation during intermission field following an error frame317.4.7 MAC overload generation during intermission field following anoverload frame317.5 Test class 5, passive error state class327.5.1 Passive error flag complet
14、ion test 1327.5.2 Data frame acceptance after passive error frame transmission337.5.3 Acceptance of 7 consecutive dominant bits after passive error flag337.5.4 Passive state unchanged on further errors347.5.5 Passive error flag completion Test case 2347.5.6 Form error in passive error delimiter357.5
15、.7 Transition from active to passive ERROR FLAG357.6 Test class 6, error counter management367.6.1 REC increment on bit error in active error flag367.6.2 REC increment on bit error in overload flag377.6.3 REC increment when active error flag is longer than 13 bits377.6.4 REC increment when overload
16、flag is longer than 13 bits387.6.5 REC increment on bit error in the ACK field387.6.6 REC increment on form error in CRC delimiter387.6.7 REC increment on form error in ACK delimiter397.6.8 REC increment on form error in EOF field397.6.9 REC increment on stuff error407.6.10 REC increment on CRC erro
17、r417.6.11 REC increment on dominant bit after end of error flag417.6.12 REC increment on form error in error delimiter427.6.13 REC increment on form error in overload delimiter427.6.14 REC decrement on valid frame reception437.6.15 REC decrement on valid frame reception during passive state437.6.16
18、REC non-increment on last bit of EOF field447.6.17 REC non-increment on 13-bit length overload flag447.6.18 REC non-increment on 13-bit length error flag457.6.19 REC non-increment on last bit of error delimiter457.6.20 REC non-increment on last bit of overload delimiter467.6.21 REC non-decrement on
19、transmission467.6.22 REC increment on form error at fixed stuff bit in FD frames477.6.23 REC non-increment on protocol exception in FD frames477.7 Test class 7, bit timing Classical CAN frame format487.7.1 Sample point test487.7.2 Hard synchronization on SOF reception497.7.3 Synchronization when e 0
20、 and e SJW(N)497.7.4 Synchronization when e 0 and e SJW(N)507.7.5 Synchronization when e 0 and |e| SJW(N)507.7.6 Synchronization when e SJW(N)517.7.7 Glitch filtering test on positive phase error517.7.8 Glitch filtering test on negative phase error527.7.9 Glitch filtering test in idle state537.7.10
21、Non-Synchronization after a dominant sampled bit547.7.11 Synchronization when e 0 and e SJW(D)597.8.4 Synchronization when e 0 and e SJW(D)617.8.5 Synchronization when e 0 and |e| SJW637.8.6 Synchronization when e SJW65InternationailvOrganization for Standardization-,-,-Licensee=ZHEJIANG INST OF STA
22、NDARDIZATIOINSCO1 52950661167 All rights reservedISO 16845-1:2016(E)7.8.7 Glitch filtering test on positive phase error677.8.8 Glitch filtering test on negative phase error697.8.9 No synchronization after a dominant sampled bit718 Test type 2, transmitted frame738.1 Test class 1, valid frame format7
23、38.1.1 Identifier and number of data bytes test in base format738.1.2 Identifier and number of data bytes test in extended format738.1.3 Arbitration in base format frame748.1.4 Arbitration in extended format frame test758.1.5 Message validation768.1.6 Stuff bit generation capability in base format f
24、rame768.1.7 Stuff bit generation capability in extended frame778.1.8 Transmission on the third bit of intermission field after arbitration lost788.2 Test class 2, error detection798.2.1 Bit error test in base format frame798.2.2 Bit error in extended format frame808.2.3 Stuff error test in base form
25、at frame818.2.4 Stuff error test in extended frame format818.2.5 Form error test828.2.6 Acknowledgement error838.2.7 Form field tolerance test for FD frame format848.2.8 Bit error at stuff bit position for FD frame payload bytes848.3 Test class 3, error frame management858.3.1 Error flag longer than
26、 6 bit858.3.2 Transmission on the third bit of intermission field after error frame858.3.3 Bit error in error flag868.3.4 Form error in error delimiter868.4 Test class 4, overload frame management878.4.1 MAC overload generation in intermission field878.4.2 Eighth bit of an error and overload delimit
27、er888.4.3 Transmission on the third bit of intermission after overload frame888.4.4 Bit error in overload flag898.4.5 Form error in overload delimiter898.5 Test class 5, passive error state and bus-off908.5.1 Acceptance of active error flag overwriting passive error flag90-,-,-8.5.2 Frame acceptance
28、 after passive error frame transmission908.5.3 Acceptance of 7 consecutive dominant bits after passive error flag918.5.4 Reception of a frame during suspend transmission928.5.5 Transmission of a frame after suspend transmission Test case 1928.5.6 Transmission of a frame after suspend transmission Te
29、st case 2938.5.7 Transmission of a frame after suspend transmission Test case 3938.5.8 Transmission of a frame without suspend transmission938.5.9 No transmission of a frame between the third bit of intermission field andeighth bit of suspend transmission948.5.10 Bus-off state948.5.11 Bus-off recove
30、ry958.5.12 Completion condition for a passive error flag968.5.13 Form error in passive error delimiter968.5.14 Maximum recovery time after a corrupted frame978.5.15 Transition from active to passive ERROR FLAG978.6 Test class 6, error counter management988.6.1 TEC increment on bit error during activ
31、e error flag988.6.2 TEC increment on bit error during overload flag998.6.3 TEC increment when active error flag is followed by dominant bits998.6.4 TEC increment when passive error flag is followed by dominant bits1008.6.5 TEC increment when overload flag is followed by dominant bits1008.6.6 TEC inc
32、rement on bit error in data frame1018.6.7 TEC increment on form error in a frame102International Organization for SItaSnOdard2iz0at1ion6 All rights reservedLicensee=ZHEJIANG INST OF STANDARDIZATION C1 5956617vISO 16845-1:2016(E)8.6.8 TEC increment on acknowledgement error1028.6.9 TEC increment on fo
33、rm error in error delimiter1038.6.10 TEC increment on form error in overload delimiter1038.6.11 TEC decrement on successful frame transmission for TEC 1271048.6.13 TEC non-increment on 13-bit long overload flag1058.6.14 TEC non-increment on 13-bit long error flag1058.6.15 TEC non-increment on form e
34、rror at last bit of overload delimiter1068.6.16 TEC non-increment on form error at last bit of error delimiter1068.6.17 TEC non-increment on acknowledgement error in passive state1078.6.18 TEC increment after acknowledgement error in passive state1078.6.19 TEC non-increment on stuff error during arb
35、itration1088.6.20 TEC non-decrement on transmission while arbitration lost1088.6.21 TEC non-increment after arbitration lost and error1098.7 Test class 7, bit timing1098.7.1 Sample point test1098.7.2 Hard synchronization on SOF reception before sample point1108.7.3 Hard synchronization on SOF recept
36、ion after sample point1118.7.4 Synchronization when e 0 and |e| SJW(N)1118.7.5 Synchronization for e SJW(N)1128.7.6 Glitch filtering test on negative phase error1138.7.7 Non-synchronization on dominant bit transmission1138.7.8 Synchronization before information processing time1148.7.9 Synchronizatio
37、n after sample point while sending a dominant bit1148.8 Test class 8, bit timing CAN FD frame format1158.8.1 Sample point test1158.8.2 Secondary sample point test1188.8.3 No synchronization within data phase bits when e 0; |e| SJW(D)1218.8.4 Glitch filtering test on negative phase error within FD fr
38、ame bits1238.8.5 No synchronization on dominant bit transmission in FD frames1249 Test type 3, bi-directional frame1259.1 Test class 1, valid frame format1259.2 Test class 2, error detection1259.3 Test class 3, active error frame management1259.4 Test class 4, overload frame management1259.5 Test cl
39、ass 5, passive-error state and bus-off1259.6 Test class 6, error counter management1269.6.1 REC unaffected when increasing TEC1269.6.2 TEC unaffected when increasing REC126-,Internationavl Oirganization for StandardizationLicensee=ZHEJIANG INST OF STANDARDIZATIOINSCO1 52950661167 All rights reserved
40、ISO 16845-1:2016(E)ForewordISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a sub
41、ject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (I
42、EC) on all matters of electrotechnical standardization.The procedures used to develop this document and those intended for its further maintenance are described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the different types of ISO documents should be
43、noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifyi
44、ng any or all such patent rights. Details of any patent rights identified during the development of the document will be in the Introduction and/or on the ISO list of patent declarations received (see www.iso.org/patents).Any trade name used in this document is information given for the convenience of users and does notconstitute an endorsement.For an explanation on the meaning of ISO specific terms and expressions related to conformity assessment, as well as information about