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1、Q8384 Q8384 Optical Spectrum Analyzer Can measure and evaluate ultra high-speed optical DWDM trans- mission systems, and optical components at high wavelength resolu- tion and high accuracy. New high-end optical spectrum analyzer adopting a new four-pass monochromator system providing high wavelengt
2、h resolution and wide dynamic range. G10 pm resolution bandwidth G20 pm wavelength accuracy (after calibration with Opt. 25) GWide dynamic range: 50 dB (0.1 nm), 60 dB (0.2 nm) GOptical frequency display GAccurate NF measurement on EDFAs GCan handle power levels as high as +23 dBm (200 mW) GAbundanc
3、e of WDM analysis functions GLimit line function for Pass/Fail analysis provided High-end Optical Spectrum Analyzer Q8384 In DWDM optical communications, exacting wavelength measurements are required of the optical source. Evaluating these specifications requires an optical spectrum analyzer with en
4、hanced resolution bandwidth and wave- length accuracy. To meet these stringent requirements, the Q8384 achieves 10 pm wavelength resolution, the best in the world* and attains 20 pm wavelength accuracy in the 1550 nm band. This high performance makes it possible for the Q8384 to measure the oscil- l
5、ation wavelength characteristics of laser diodes accurately. DWDM optical communication systems also contain wavelength division multiplexed channels spaced at intervals as close as 50 GHz (0.4 nm). In this environment an optical spec- trum analyzer with superior dynamic range is required to separat
6、e the optical signals and measure the noise figure (NF) of the optical amplifier. The Q8384 has a dynamic range as wide as 50 dB at 0.1 nm and 60 dB at 0.2 nm and therefore fulfills these requirements ade- quately. Equipped with automatic optical amplifier NF measurement and arithmetic facilities, t
7、he instrument allows the user to make measurements in a simple fashion. The Q8384 optionally has a built-in reference wavelength light source and an EE-LED (edge emitting LED). If calibrated with this refer- ence light source, the instrument is assured to provide wavelength accuracy of 20 pm in the
8、1550 nm band. Using the EE-LEDs broad-band light source, the Q8384 allows the user to con- veniently measure and evaluate the transmis- sion and loss characteristics of narrow-band optical filters. *: at the time of printing (June, 2001) 2Q8384-8E June 01 Excellent Basic Performance 10 pm high wavel
9、ength resolution The Q8384 realizes a wavelength resolution bandwidth as high as 10 pm through the employment of a newly developed monochromator system. This makes it possible to measure and evaluate the side bands of optical signals which are inten- sity modulated at 10 Gbps, a task formerly imposs
10、ible with conventional spectrum analyzers. 20 pm high wavelength accuracy The Q8384 can measure wavelengths at an accuracy of 20 pm within the wavelength range of the 1530 to 1570 nm C-band and at 40 pm within the L-band range of 1570 to 1610 nm after being calibrated with the built-in calibration l
11、ight source (option 25). It can accurately evaluate the exacting characteris- tics of laser diodes and optical filters used in DWDM transmis- sion systems. Since the Q8384 provides a wavelength linearity of 10 pm for the wavelength range of 1530 to 1570 nm, it can also accurately measure the wavelen
12、gth interval of wave- length division multiplexed signals. FIG. 1 Resolution band width of 10 pm FIG. 2 Sample waveform modulated at 10 Gbps FIG. 3 A measurement example of a Fabry-Perot filter Wavelength spacing can be measured with satisfactory linearity. Q8384-8E June 01 3 Measuring the noise fig
13、ure of an optical fiber amplifier The Q8384 makes one button measurements of the noise figure with high accuracy possible through performance enhancements in dynamic range, polarization dependency, level accuracy, linearity, wavelength resolution setting accu- racy, etc. and applying curve fitting a
14、nd other functions. Since the Q8384 can accurately determine the ASE level of DWDM signals that are multiplexed at intervals of 50 GHz (0.4 nm) or narrower, it provides not only the capability to perform accu- rate noise figure measurements but also the capability to show a listing of multiple measu
15、rement results at the same time. 50 dB (0.1 nm)/60 dB (0.2 nm) wide dynamic ranges Signals are subject to wavelength division multiplexing spaced at 50 GHz (0.4 nm) or shorter intervals in a DWDM system. An optical spectrum analyzer with superior dynamic range is required to separate and measure the
16、se tightly spaced signals. The Q8384 realizes a dynamic range of 60 dB or more at 0.2 nm making it ideal for this task. At 0.1 nm, the instrument provides a dynamic range of 50 dB or more, thus enabling it to support future DWDM systems with signals at even closer intervals. +23 dBm (200 mW) high-po
17、wer direct input The Q8384 can directly measure high-power signals from fiber amplifiers or pumped laser diodes without attenuation. Abundance of analysis features Frequency sweep function The Q8384 allows the display of optical frequencies on the horizontal axis; This is ideal for measuring the sta
18、ndardized wavelength grid frequencies specified by the ITU-T (ITU Telecommunication Standardization Sector). FIG. 6 Diagram of NF measurement using the interpolation method FIG. 7 Measurement Example, DWDM (50 GHz) Noise Figure The measured waveform and a list of the obtained measurements are dis- p
19、layed at the same time. FIG. 4 Dynamic range 50dB 60dB 67dB 0.1nm 0.2nm 0.4nm 4Q8384-8E June 01 FIG. 5 Optical Fiber Amplifier Measurement using Frequency Sweep Function WDM Analysis function The Q8384 can display a maximum of 256 peak wavelengths and power levels of WDM signals. It can show wavelen
20、gth and power level as deviations from the ITU-T channel spacing or from a reference signal as well as in absolute values. Alternate sweep function The Q8384 can show two sets of measurement data with dif- ferent setup conditions in two windows. These windows are always rewritable using the alternat
21、e sweep function of the Q8384. With this function the user can make detailed mea- surements of signals in a specific wavelength band while moni- toring the entire wavelength area of the WDM system. FIG. 8 SNR display Wavelength-specific S/N ratio measurements are displayed. FIG. 9 Relative display D
22、ifferences from channel spacing and a reference signal are displayed. FIG. 11 WDM alternate sweeping Upper: 5 nm SPAN, Lower: 50 nm SPAN FIG. 10 ITU-T grid display The nearest ITU-T channel and its difference are displayed Pulse measuring function The Q8384 supports long-distance transmission loop t
23、ests using an externally synchronized sweep function. It can mea- sure very weak signals satisfactorily since it has a high sensitiv- ity of approximately -65 dBm. Moreover, a pulse sweeping function makes it possible to measure a peak value of the mea- sured light. Even pulsed light can be measured
24、 without miss- ing any portion. FIG. 12 Sample loop test measurement with the externally synchro- nized sweep function (5000 km transmission line) Q8384-8E June 01 5 FIG. 13 Upper: measuring signal, 2 nm SPAN. Lower: reference signal, 30 nm SPAN Although prior measurement systems required that refer
25、ence and measuring signals be put under the same conditions, the Q8384 enables measurements even if these signals are under different conditions. FIG. 14 Notch filter: wavelength width at 3 dB loss FIG. 15 Notch filter: loss measurement with a wavelength width of 0.5 nm 6 Q8384-8E June 01 FIG. 16 Mu
26、lti-trace display Measurement example of AWG (100 GHz, 32 Ch) provided by NTT Electronics Corporation. Multi-trace display function The Q8384 supports cascaded display of up to 32 traces, which allows the simultaneously display of multi-channel device characteristics such as from AWGs. FIG. 17 Limit
27、 line function Limit line function The Q8384 users can define limit lines for the DWDM signal spectrum or loss wavelength characteristics of an optical device to judge whether measurments fall between the upper and lower limits. This function can be used for Pass/Fail analysis on optical device manu
28、facturing lines. Transmission and loss measurement function In conventional transmission/loss measurements of an optical filter, it was necessary to measure a reference signal in advance and then carry out the intended measurements on the real signal under the same conditions. Since the Q8384 has a
29、built-in zoom function, the user can make transmission and loss measurements while varying the center wavelength and measurement span freely within the wavelength range of the reference signal once the reference signal is measured in a wide wavelength range. The user does not need to measure the ref
30、- erence signal every time a different sample is used, thus enabling efficient measurement of transmission and loss char- acteristics. The Q8384 also permits one button measurement of cutoff frequency range of notch filters using a fiber grating filter and the pass band of band pass filters. Q8384-8
31、E June 017 WDM monitor function The Q8384 allows monitoring of DWDM systems. It is possi- ble to continuously monitor whether the peak wavelength, the level of each channel and the SNR fluctuation are within their respective tolerances. It is also possible to simultaneously dis- play the current val
32、ues relative to the initial value, 1st channel value, and reference value as well as displaying the absolute value. FIG. 18 WDM monitor (wavelength mode) FIG. 19 WDM monitor (level mode) Display example of level variations in each channel FIG. 20 WDM monitor (SNR mode) SNR display with channel No. o
33、n the horizontal axis (with limit line) Data storage capabilities The Q8384 can store data in two formats with the built-in standard floppy disk drive. TEXT format (numeric format) Measurement conditions and data are in ASCII format. The stored data may be restored by the Q8384 or read directly with
34、 a personal computer. BITMAP format The BITMAP format is used to store a bitmap image of the screen display on a floppy disk with no data manipulation. Built-in printer Additionally, the built-in high-speed thermal printer allows the user to make hardcopy images of measured data. Calibration light s
35、ource with EE-LED Output (OPTION 25) Built-in wavelength calibration light source with acetylene cell to guarantee high-precision wavelength accuracy, and the 1550 nm C-band EE-LED (Edge Emitting LED) light source. This LED source can also be used as a low level broadband light source for device mea
36、surement. MAX/MIN/CURRENT simultaneous display function The Q8384 can simultaneously display the waveforms of the maximum value, minimum value, and current value of each measurement in repeated sweep. Display of the fluctuation range enables the user to understand at a glance the changes of the devi
37、ce characteristics against temperature and polarization change. FIG. 21 MAX/MIN/CURRENT simultaneous display Display example of the characteristics when the temperature of the Band Pass Filter changes. Option 25 Q8384-8E June 018 Performance Parameters Wavelength Measurement range:600 to 1700 nm Acc
38、uracy:500 pm Accuracy*1:20 pm (after calibration with built-in light source, option 25, 1530 to 1570 nm) 40 pm (after calibration with built-in light source, option 25, 1570 to 1610 nm) 200 pm (using built-in or ext. single point calibration light source, 600 to 1700nm) Linearity* 1: 10 pm (1530 to
39、1570 nm) 20 pm (1570 to 1610 nm) Repeatability* 1, *4: 3 pm (1530 to 1610 nm) Wavelength resolution Settings: 10 pm, 20 pm, 50 pm,100 pm, 200 pm, 500 pm Accuracy* 1, *6: 3% (Res. 50 pm, 1530 to 1610 nm) 2% (Res. 100 pm or more, 1530 to 1610 nm) Level Measurement range* 2, *3: -87 to +23 dBm (1250 to
40、 1610 nm) -77 to +23 dBm (950 to 1250, 1610 to 1700 nm) -55 to +23 dBm (600 to 1000 nm) Accuracy* 1, *3: 0.4 dB (1550 nm) Linearity* 1: 0.05 dB (-50 to -10 dBm, 1550 nm) Scale:Logarithmic 0.1, 0.2, 0.5, 1, 2, 5, 10 dB/DIV plus others user selectable, and Linear Repeatability* 1, *3, *4: 0.02 dB (153
41、0 to 1610 nm) Flatness* 1: 0.2 dB (1530 to 1610 nm) Polarization dependency* 1, *3: 0.05 dB (1250 to 1610 nm) Dynamic range* 1, *5: 50 dB (0.1 nm from peak wavelength) 60 dB (0.2 nm from peak wavelength) 67 dB (0.4 nm from peak wavelength, High Dynamic Range Mode) Sweep Span:0.2 nm from full span or
42、 zero span Number of samples:101, 201, 501, 1001, 2001, 5001, 10001 Measurement time:500 ms (Span 10 nm, Normal Mode, 1550 nm, average 1 time, 501 samples) Pulse Light Measurement Peak holding mode:Waiting time is set every one measurement point (Gate Time 1 ms to 1 S) and the peak level during this
43、 waiting time is displayed Minimum optical pulse width 10 nSec (30 Sec or longer recommended) Optical pulse frequency; 1 Hz or more External synchronization: The timing can be controlled by a SYNC signal at the external input. SYNC signal input level; TTL (High; 3.5 V, Low; 1.5 V) Pulse width; 10 ns
44、 or more SyncLo Mode:Minimum light pulse width measurement during SYNC high level is 10 ns (30 s or longer recommended) SyncHi Mode:Sample timing from the rising or falling edge of the SYNC signal is set (0 to 1000 s) *1) At 23C 5C*4) At 1 min. repetition rate *2) At 10 to 30C *5) At 1523 nm wavelen
45、gth, resolution 10 pm *3) At least 100 pm resolution*6) Correction by effective bandwidth Features Memory feature Internal RAM:Measurement data; at least 15 screens (501 samples) (battery backup) Internal floppy DISK:3.5 inch 2 HD 1.44 M, MS-DOS format Display:Wavelength/Frequency display on the hor
46、izontal axis, dual upper/lower display, superimpose display, cursor measurements, multi-trace display (up to 32 traces) Operations/Analysis:Auto peak search, Auto peak center, Auto reference level, Spectrum width analysis (Threshold, Envelope, RMS, Peak RMS, X nm level), Notch width analysis (X dB w
47、idth, X nm level), Optical amplifier Noise Figure analysis function (up to 256 wavelengths), WDM signal analysis function (up to 256 wavelengths, level, SNR, ITU-T grid), Normalize with zoom function (LOSS/TRANS), WDM monitor function, limit line function, Peak power monitor function (with trend cha
48、rt) Others:Wave length correction (built-in or external light source), wavelength/level offset correction, Label feature Optical input Internal adapting fiber:9.5/125 m SM fiber (master grade-A connector recommended) Reflective attenuation:35 dB Connector (user replaceable):FC (Std.), ST, SC (access
49、ories sold separately) Data Input/Output GPIB:IEEE488-1978 Printer:Internal thermal printer Printer interface:D-SUB 25 pin ESC/P, ESC/P-R, PCL Video output:VGA (15 pins, female) LabView and LabWindows driver available on request OptionsOPT8384+25 Light Source for wavelength calibration with EE-LED and acetylene cell output: Output level* 1;-45 dBm/nm (1550 nm) Environmental Specifications Operating temperature:+10 to +40C, Relative humidity 85% or less (non-condensing) Storage temperature:-10to +50C, Relative humidity 90% or less (non-condensing) Power Supply:AC100-120 V/220